figure naf2 3 accessibility wedge probe

Brand Name:HongCe

Model Number:HT-U14

Place of Origin:China

... not be used in lieu of construction features that prevent access to hazardous moving parts. Test Finger Probe For HOUSEHOLD / HOME OFFICE DOCUMENT SHREDDERS , the Following additional compliance criteria apply: The accessibility probe/wedge illustrated in

Place of Origin:China

Brand Name:Julixing

Model Number:LX-S113

...Wedge Probe for Paper Shredders 1. Specification: Length: 300 mm Bent finger diameter: 12 mm Bendable Section: 30/30/40 mm Baffle diameter: 50 mm Baffle length: 100 mm Material: Stainless steel Reference: UL60950 Fig NAF.2 and NAF.3 2. Reference standard: UL60950 Figure NAF2 and NAF3 3. Product Details: This product is used for testing access...

Brand Name:PEGO

Model Number:PG-WP

Place of Origin:China

Wedge Probe Designed according to IEC60950 for Paper Shredder Inlet 1. Introduction Wedge probe is designed according to UL60950 figure NAF.2 and NAF.3, IEC60950 and IEC62368 figure V.4, it is for safety test of paper shredder inlet. 2. Application It is applied to test the protection against the slot opening of paper shredder inlet, the probe can not access to the hazardous moving parts. 2. Specification Distance from Probe Tip (mm) Probe

Brand Name:kingpo

Place of Origin:china

Wedge Probe For Document Shredder The wedge probe is one of two new accessibility probes required by UL 60950 for paper shredders. UL found that children and small women could touch hazardous parts of some shredders. Calibration Certificate:Figure V.4 Wedge probe...

Brand Name:SHC

Model Number:SC-F V. 1 V.2 V.3 V.4 V.5

Place of Origin:China

...Figure V.1 V.2 V.3 V.4 V.5 Telecom Terminal Test Probes IEC62368 probe no. Probe Name IEC 62368 Figure V.1 Jointed test probe for equipment likely to be accessible to children IEC62368 Figure V.2 Jointed test probe for equipment like to be accessible to children IEC62368 Figure V.3 Blunt probe, Telecom Test Probe IEC62368 Figure V.4 Wedge probe IEC62368 Figure V.5 Terminal probe I) IEC 62368 Figure V.1 Jointed test probe...