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| Categories | Scanning Microscope | 
|---|---|
| Brand Name: | OPTO-EDU | 
| Model Number: | A62.4503 | 
| Certification: | CE, Rohs | 
| Place of Origin: | China | 
| MOQ: | 1pc | 
| Price: | FOB $1~1000, Depend on Order Quantity | 
| Payment Terms: | L/C,T/T,Western Union | 
| Supply Ability: | 5000 pcs/ Month | 
| Delivery Time: | 5~20 Days | 
| Packaging Details: | Carton Packing, For Export Transportation | 
| Work Mode: | "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode" | 
| Current Spectrum Curve: | "RMS-Z Curve F-Z Force Curve" | 
| XY Scan Range: | 50×50um | 
| XY Scan Resolution: | 0.2nm | 
| Z Scan Range: | 5um | 
| Y Scan Resolution: | 0.05nm | 
| Scan Speed: | 0.6Hz~30Hz | 
| Scan Angle: | 0~360° | 
| Sample Size: | "Φ≤90mm H≤20mm" | 
| Shock-Absorbing Design: | "Spring Suspension Metal Shielding Box" | 
| Optical Syestem: | "10x Objective Resolution 1um" | 
| Output: | USB2.0/3.0 | 
| Software: | Win XP/7/8/10 | 
| Company Info. | 
| Opto-Edu (Beijing) Co., Ltd. | 
| Verified Supplier | 
| View Contact Details | 
| Product List | 


| ◆ The laser detection head and the sample scanning stage are
integrated, the structure is very stable, and the anti-interference
is strong ◆ Precision probe positioning device, laser spot alignment adjustment is very easy ◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan ◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample ◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected ◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area ◆ Spring suspension shockproof method, simple and practical, good shockproof effect ◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment ◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98% | 


| Specification | A62.4500 | A62.4501 | A62.4503 | A62.4505 | 
| Work Mode | Tapping Mode 【Optional】 Contact Mode Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode | 
| Current Spectrum Curve | RMS-Z Curve 【Optional】 F-Z Force Curve | RMS-Z Curve F-Z Force Curve | RMS-Z Curve F-Z Force Curve | RMS-Z Curve F-Z Force Curve | 
| XY Scan Range | 20×20um | 20×20um | 50×50um | 50×50um | 
| XY Scan Resolution | 0.2nm | 0.2nm | 0.2nm | 0.2nm | 
| Z Scan Range | 2.5um | 2.5um | 5um | 5um | 
| Y Scan Resolution | 0.05nm | 0.05nm | 0.05nm | 0.05nm | 
| Scan Speed | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz | 0.6Hz~30Hz | 
| Scan Angle | 0~360° | 0~360° | 0~360° | 0~360° | 
| Sample Size | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | Φ≤90mm H≤20mm | 
| XY Stage Moving | 15×15mm | 15×15mm | 25×25um | 25×25um | 
| Shock-Absorbing Design | Spring Suspension | Spring Suspension Metal Shielding Box | Spring Suspension Metal Shielding Box | - | 
| Optical Syestem | 4x Objective Resolution 2.5um | 4x Objective Resolution 2.5um | 4x Objective Resolution 2.5um | Eyepiece 10x Infinity Plan LWD APO 5x10x20x50x 5.0M Digital Camera 10" LCD Monitor, With Measuring LED Kohler Illumination Coaxial Coarse & Fine Focusing | 
| Output | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 | USB2.0/3.0 | 
| Software | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 | Win XP/7/8/10 | 

| Resolution | Working Condition | Working Temperation | Damge to Sample | Inspection Depth | |
| SPM | Atom Level 0.1nm | Normal, Liquid, Vacuum | Room or Low Temperation | None | 1~2 Atom Level | 
| TEM | Point 0.3~0.5nm Lattice 0.1~0.2nm | High Vaccum | Room Temperation | Small | Usually <100nm | 
| SEM | 6-10nm | High Vaccum | Room Temperation | Small | 10mm @10x 1um @10000x | 
| FIM | Atom Level 0.1nm | Super High Vaccum | 30~80K | Damge | Atom Thickness | 
| Microscope | Optical Microscope | Electron Microscope | Scanning Probe Microscope | 
| Max Resolution (um) | 0.18 | 0.00011 | 0.00008 | 
| Remark | Oil immersion 1500x | Imaging diamond carbon atoms | Imaging high-order graphitic carbon atoms | 
|  |  |  | 
| Probe-Sample Interaction | Measure Signal | Information | 
| Force | Electrostatic Force | Shape | 
| Tunnel Current | Current | Shape, Conductivity | 
| Magnetic Force | Phase | Magnetic Structure | 
| Electrostatic Force | Phase | charge distribution | 




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