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Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um
Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um
Categories Scanning Microscope
Brand Name: OPTO-EDU
Model Number: A62.4501
Certification: CE, Rohs
Place of Origin: China
MOQ: 1pc
Price: FOB $1~1000, Depend on Order Quantity
Payment Terms: L/C,T/T,Western Union
Supply Ability: 5000 pcs/ Month
Delivery Time: 5~20 Days
Packaging Details: Carton Packing, For Export Transportation
Work Mode: "Contact Mode Tapping Mode 【Optional】 Friction Mode Phase Mode Magnetic Mode Electrostatic Mode"
Current Spectrum Curve: "RMS-Z Curve F-Z Force Curve"
XY Scan Range: 20×20um
XY Scan Resolution: 0.2nm
Z Scan Range: 2.5um
Y Scan Resolution: 0.05nm
Scan Speed: 0.6Hz~30Hz
Scan Angle: 0~360°
Sample Size: "Φ≤90mm H≤20mm"
Shock-Absorbing Design: "Spring Suspension Metal Shielding Box"
Optical Syestem: "4x Objective Resolution 2.5um"
Output: USB2.0/3.0
Software: Win XP/7/8/10
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Company Info.
Opto-Edu (Beijing) Co., Ltd.
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Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

  • Basic Level, Separate Controller & Main Body Design, With Contact Mode, Tapping Mode,
  • Scan Range XY 20x20um, Z 2.5um, Scan Resolution XY 0.2nm, Z 0.05nm
  • Sample Size Dia.<90mm, H<20mm, Stage Moving 15x15mm, Optical Objective APO 4x Resolution 2.5um
  • Scan Speed 0.6~30Hz, Scan Angle 0-360°, Output USB3.0 For Win7/8/10/11
  • Optional Work Mode: Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
◆ The laser detection head and the sample scanning stage are integrated, the structure is very stable, and the anti-interference is strong
◆ Precision probe positioning device, laser spot alignment adjustment is very easy
◆ The single-axis drive sample automatically approaches the probe vertically, so that the needle tip is perpendicular to the sample scan
◆ The intelligent needle feeding method of motor-controlled pressurized piezoelectric ceramic automatic detection protects the probe and the sample
◆ High-precision and wide-ranging piezoelectric ceramic scanners can be freely selected
◆ High-magnification objective lens automatic optical positioning, no need to focus, real-time observation and positioning of the probe sample scanning area
◆ Spring suspension shockproof method, simple and practical, good shockproof effect
◆ Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of the working environment
◆ Integrated scanner nonlinear correction user editor, nanometer characterization and measurement accuracy better than 98%


SpecificationA62.4500A62.4501A62.4503A62.4505
Work ModeTapping Mode
【Optional】
Contact Mode
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode		Contact Mode
Tapping Mode
【Optional】
Friction Mode
Phase Mode
Magnetic Mode
Electrostatic Mode
Current Spectrum CurveRMS-Z Curve
【Optional】
F-Z Force Curve		RMS-Z Curve
F-Z Force Curve		RMS-Z Curve
F-Z Force Curve		RMS-Z Curve
F-Z Force Curve
XY Scan Range20×20um20×20um50×50um50×50um
XY Scan Resolution0.2nm0.2nm0.2nm0.2nm
Z Scan Range2.5um2.5um5um5um
Y Scan Resolution0.05nm0.05nm0.05nm0.05nm
Scan Speed0.6Hz~30Hz0.6Hz~30Hz0.6Hz~30Hz0.6Hz~30Hz
Scan Angle0~360°0~360°0~360°0~360°
Sample SizeΦ≤90mm
H≤20mm		Φ≤90mm
H≤20mm		Φ≤90mm
H≤20mm		Φ≤90mm
H≤20mm
XY Stage Moving15×15mm15×15mm25×25um25×25um
Shock-Absorbing DesignSpring SuspensionSpring Suspension
Metal Shielding Box		Spring Suspension
Metal Shielding Box		-
Optical Syestem4x Objective
Resolution 2.5um		4x Objective
Resolution 2.5um		4x Objective
Resolution 2.5um		Eyepiece 10x
Infinity Plan LWD APO 5x10x20x50x
5.0M Digital Camera
10" LCD Monitor, With Measuring
LED Kohler Illumination
Coaxial Coarse & Fine Focusing
OutputUSB2.0/3.0USB2.0/3.0USB2.0/3.0USB2.0/3.0
SoftwareWin XP/7/8/10Win XP/7/8/10Win XP/7/8/10Win XP/7/8/10

　ResolutionWorking ConditionWorking TemperationDamge to SampleInspection Depth
SPMAtom Level 0.1nmNormal, Liquid, VacuumRoom or Low TemperationNone1~2 Atom Level
TEMPoint 0.3~0.5nm
Lattice 0.1~0.2nm		High VaccumRoom TemperationSmallUsually <100nm
SEM6-10nmHigh VaccumRoom TemperationSmall10mm @10x
1um @10000x
FIMAtom Level 0.1nmSuper High Vaccum30~80KDamgeAtom Thickness
MicroscopeOptical MicroscopeElectron MicroscopeScanning Probe Microscope
Max Resolution (um)0.180.000110.00008
RemarkOil immersion 1500xImaging diamond carbon atomsImaging high-order graphitic carbon atoms
Probe-Sample InteractionMeasure SignalInformation
ForceElectrostatic ForceShape
Tunnel CurrentCurrentShape, Conductivity
Magnetic ForcePhaseMagnetic Structure
Electrostatic ForcePhasecharge distribution
Product Tags:

curve basic level scanning microscope

  

atomic force scanning microscope

  

scanning opto edu microscope

  
Quality Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um wholesale

Opto Edu A62.4501 Scanning Microscope with Atomic Force AFM XY Scan Range 20×20um XY Scan Resolution 0.2nm Z Scan Range 2.5um

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